Volume 7, Issue 3
Raw Silk Quality Index Comparison between Electronic Tester and Seriplane Test System

Jianmei Xu, Dongping Wu, Ying Zhou, Suozhuai Dong & Francesco Gatti

Journal of Fiber Bioengineering & Informatics, 7 (2014), pp. 339-348.

Published online: 2014-07

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  • Abstract

A new electronic tester consisting of capacitive sensors and optical sensors is now introduced into raw silk inspection. Compared with the traditional seriplane test, the quality indices change a lot. In assessing the yarn evenness, the electronic tester measures the coefficient of variation of the raw silk size (CV_{even}%, CV_{5 m}%, CV_{50 m}%), while the seriplane uses evenness II. In assessing the yarn defects, the electronic tester measures the slubs, thick places and thin places, SIE (small imperfection element), while the seriplane test uses cleanness and neatness. However, raw silk users who have been used to the seriplane test report want to know how to interpret the electronic test indices, they want to be convinced by knowing the correlation between the indices of the two test systems. In this study 50 lots of raw silk are sampled and tested by the two test systems, and the correlation coefficients of the corresponding indices are computed and analyzed. The result shows that there are significant correlation between evenness II and CV_{5 m}%, a strong correlation between cleanness and slub by the optical sensor, a strong correlation between neatness and SIE by both the capacitive and the optical sensor, and a strong correlation between neatness and the thick and thin places by optical sensor. The result confirms the substitution of the electronic test for seriplane test in future from the technical viewpoint.

  • Keywords

Electronic Tester for Raw Silk Seriplane Test Defects Yarn Evenness

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@Article{JFBI-7-339, author = {}, title = {Raw Silk Quality Index Comparison between Electronic Tester and Seriplane Test System}, journal = {Journal of Fiber Bioengineering and Informatics}, year = {2014}, volume = {7}, number = {3}, pages = {339--348}, abstract = {A new electronic tester consisting of capacitive sensors and optical sensors is now introduced into raw silk inspection. Compared with the traditional seriplane test, the quality indices change a lot. In assessing the yarn evenness, the electronic tester measures the coefficient of variation of the raw silk size (CV_{even}%, CV_{5 m}%, CV_{50 m}%), while the seriplane uses evenness II. In assessing the yarn defects, the electronic tester measures the slubs, thick places and thin places, SIE (small imperfection element), while the seriplane test uses cleanness and neatness. However, raw silk users who have been used to the seriplane test report want to know how to interpret the electronic test indices, they want to be convinced by knowing the correlation between the indices of the two test systems. In this study 50 lots of raw silk are sampled and tested by the two test systems, and the correlation coefficients of the corresponding indices are computed and analyzed. The result shows that there are significant correlation between evenness II and CV_{5 m}%, a strong correlation between cleanness and slub by the optical sensor, a strong correlation between neatness and SIE by both the capacitive and the optical sensor, and a strong correlation between neatness and the thick and thin places by optical sensor. The result confirms the substitution of the electronic test for seriplane test in future from the technical viewpoint.}, issn = {2617-8699}, doi = {https://doi.org/10.3993/jfbi09201404}, url = {http://global-sci.org/intro/article_detail/jfbi/4790.html} }
TY - JOUR T1 - Raw Silk Quality Index Comparison between Electronic Tester and Seriplane Test System JO - Journal of Fiber Bioengineering and Informatics VL - 3 SP - 339 EP - 348 PY - 2014 DA - 2014/07 SN - 7 DO - http://doi.org/10.3993/jfbi09201404 UR - https://global-sci.org/intro/article_detail/jfbi/4790.html KW - Electronic Tester for Raw Silk KW - Seriplane Test KW - Defects KW - Yarn Evenness AB - A new electronic tester consisting of capacitive sensors and optical sensors is now introduced into raw silk inspection. Compared with the traditional seriplane test, the quality indices change a lot. In assessing the yarn evenness, the electronic tester measures the coefficient of variation of the raw silk size (CV_{even}%, CV_{5 m}%, CV_{50 m}%), while the seriplane uses evenness II. In assessing the yarn defects, the electronic tester measures the slubs, thick places and thin places, SIE (small imperfection element), while the seriplane test uses cleanness and neatness. However, raw silk users who have been used to the seriplane test report want to know how to interpret the electronic test indices, they want to be convinced by knowing the correlation between the indices of the two test systems. In this study 50 lots of raw silk are sampled and tested by the two test systems, and the correlation coefficients of the corresponding indices are computed and analyzed. The result shows that there are significant correlation between evenness II and CV_{5 m}%, a strong correlation between cleanness and slub by the optical sensor, a strong correlation between neatness and SIE by both the capacitive and the optical sensor, and a strong correlation between neatness and the thick and thin places by optical sensor. The result confirms the substitution of the electronic test for seriplane test in future from the technical viewpoint.
Jianmei Xu, Dongping Wu, Ying Zhou, Suozhuai Dong & Francesco Gatti. (2019). Raw Silk Quality Index Comparison between Electronic Tester and Seriplane Test System. Journal of Fiber Bioengineering and Informatics. 7 (3). 339-348. doi:10.3993/jfbi09201404
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