Volume 9, Issue 1
The Characteristic Finite Element Alternating-direction Method with Moving Meshes for the Transient Behavior of a Semiconductor Device

Y. Yuan

Int. J. Numer. Anal. Mod., 9 (2012), pp. 86-104

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  • Abstract

For the transient behavior of a semiconductor device, the modified method of characteristics finite element alternating-direction procedures with moving meshes are put forward. Some techniques, such as calculus of variations, operator-splitting, characteristic method, generalized L^2 projection, energy method, negative norm estimate and prior estimates and techniques are employed. Optimal order estimates in L^2 norm are derived for the error in the approximation solution. Thus the well-known theoretical problem has been thoroughly and completely solved.

  • History

Published online: 2012-09

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