TY - JOUR
T1 - Dependence of Four-Wave Mixing Line-Shape on Micrometric Atomic Vapor Thickness
AU - Li , Li
AU - Lu , Yi-Xin
AU - Li , Yuan-Yuan
JO - Journal of Atomic and Molecular Sciences
VL - 4
SP - 337
EP - 343
PY - 2010
DA - 2010/01
SN - 1
DO - http://doi.org/10.4208/jams.060310.072010a
UR - https://global-sci.org/intro/article_detail/jams/8095.html
KW - four-wave mixing, micrometric atomic vapor, Dicke-narrowing, polarization interference.
AB - <p style="text-align: justify;">We theoretically examine thickness and wavelength dependence line-shape of 
four-wave-mixing (FWM) spectroscopy in micrometric thin atomic vapors whose 
thickness $L$ is assumed to be 10,30,50,80 and 100 $\mu$m respectively. It is 
found that a narrow centre (Dicke-narrowing) persists for all cases, while 
wings are broadened as the thickness of the vapor increases or the pump wavelength 
decreases comparing to the probe wavelength. This type of spectrum is due to 
the modified velocity distribution and polarization interference from different 
ensemble of atoms in a confined situation.</p>