TY - JOUR
T1 - Detection of Electromagnetic Inclusions Using Topological Sensitvity
AU - Wahab , Abdul
AU - Abbas , Tasawar
AU - Ahmed , Naveed
AU - Zaigham Zia , Qazi Muhammad
JO - Journal of Computational Mathematics
VL - 5
SP - 642
EP - 671
PY - 2017
DA - 2017/10
SN - 35
DO - http://doi.org/10.4208/jcm.1609-m2016-0498
UR - https://global-sci.org/intro/article_detail/jcm/10036.html
KW - Electromagnetic imaging, Topological derivative, Localization, Resolution
analysis, Stability analysis, Medium noise, Measurement noise.
AB - <p style="text-align: justify;">In this article, a topological sensitivity framework for far-field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far-field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion. The stability of the framework with respect to measurement and medium noises is discussed. Moreover, the quantitative results for signal-to-noise ratio are presented. A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.</p>