@Article{CiCP-20-179,
author = {SeongMin Kim, Jaewook Ha, Hyeok Kim and Jin-Baek Kim},
title = {Analytical Study on Piezoelectric Effects on Exciton Dissociation},
journal = {Communications in Computational Physics},
year = {2018},
volume = {20},
number = {1},
pages = {179--187},
abstract = {<p style="text-align: justify;">We analytically and numerically compute the Onsager dissociation rate (exciton
dissociation) on an interface induced by a piezoelectric potential in an inorganic-organic
hybrid p-n junction system (ZnO + (poly(p-phenylene vinylene)); PPV).
When a positive piezoelectric potential is created at the interface region owing to the
deformation of the system, free electrons accumulate at the interface. Hence, screening
effects are observed. It is assumed that the electron layer formed at the interface then
attracts free holes from the p-type PPV region, which leads to exciton formation, possibly
via the Langevin recombination process. The increased exciton density can then
contribute to the Onsager dissociation rate, which is maximum around the interface.
This paper focuses on the role of piezoelectric effects in promoting exciton formation
at the interface and its relation with the exciton dissociation rate.</p>},
issn = {1991-7120},
doi = {https://doi.org/10.4208/cicp.140515.161115a},
url = {http://global-sci.org/intro/article_detail/cicp/11149.html}
}